Rapid developments in satellite and sensor technologies have increased the availability of high-resolution, remotely sensed images faster than researchers can process and analyze the data manually.

A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...

Technology is continuously advancing and exponentially increasing the amount of data produced. Data comes from a multitude of sources and formats, requiring systems to process different algorithms.

Himax Technologies, Inc. (Nasdaq: HIMX) (“Himax” or “Company”), a leading supplier and fabless manufacturer of display drivers and other semiconductor products, today announced the launch of its new ...

AI success depends on whether enterprise data is ready, reachable, and close enough to the workloads that need it. In this eSpeaks episode, Dell Technologies’ Vrashank Jain explains why fragmented ...