Crystals are ubiquitous: most metals, for example, are crystalline. Known for the almost perfect organization of their atoms, crystals nonetheless always contain imperfections, which are called ...

Defects and contamination on the wafer can slow process development times and limit performance and yield. As chips get more complex, more defects can become buried within the increasing number of ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...